- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02003 - Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
Patent holdings for IPC class G01B 9/02003
Total number of patents in this class: 38
10-year publication summary
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0
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0
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0
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0
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2
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1
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11
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11
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8
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3
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| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 6816 |
3 |
| Aurora Operations, Inc. | 410 |
3 |
| Raytheon Company | 8535 |
2 |
| Omron Corporation | 6968 |
2 |
| Mitutoyo Corporation | 1218 |
2 |
| UT-Battelle, LLC | 1333 |
2 |
| OnPoint Technologies, LLC | 56 |
2 |
| NEC Corporation | 32703 |
1 |
| Hitachi, Ltd. | 16452 |
1 |
| Lockheed Martin Corporation | 3406 |
1 |
| Tsinghua University | 5426 |
1 |
| Nippon Telegraph and Telephone Corporation | 14195 |
1 |
| Carl Zeiss SMT GmbH | 2646 |
1 |
| ams International AG | 399 |
1 |
| Board of Trustees of Michigan State University | 1141 |
1 |
| Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences | 19 |
1 |
| Dental Imaging Technologies Corporation | 126 |
1 |
| Eth Zurich | 1193 |
1 |
| The Government of The United States of America, AS represented by The Secretary of Commerce | 43 |
1 |
| Harbin Institute of Technology | 356 |
1 |
| Other owners | 9 |